ATOMIC FORCE MICROSCOPIC

$0.00

Product Overview

The Anton Paar STEP 700 is an advanced nanomechanical characterization platform that combines Atomic Force Microscopy (AFM) with ultra-nanoindentation and mechanical property mapping capabilities. Integrated with the MCT³, UNHT³, and Nanosurf Nanite AFM modules, the system enables comprehensive analysis of surface topography, roughness, hardness, elastic modulus, adhesion, and nanomechanical behavior at micro- and nanometer scales.

This versatile platform is particularly valuable for biomaterials, dental materials, polymers, coatings, thin films, and advanced material research, providing both morphological and mechanical characterization within a single integrated system.

Key Features

  • High-resolution Atomic Force Microscopy (AFM)

  • Three-dimensional nanoscale surface imaging

  • Ultra Nano Hardness Testing (UNHT³)

  • Quantitative nanomechanical property mapping

  • Surface roughness and texture analysis

  • Elastic modulus and hardness determination

  • Adhesion and force spectroscopy measurements

  • High-precision indentation and scratch testing

  • Non-destructive surface characterization

  • Automated data acquisition and analysis

Applications

  • Dental material characterization

  • Biomaterials and tissue engineering research

  • Surface roughness evaluation

  • Nanoindentation and hardness testing

  • Thin film and coating analysis

  • Polymer characterization

  • Nanotechnology and nanomaterials research

  • Wear and tribological studies

  • Surface modification assessment

  • Microstructural and mechanical property evaluation

Technical Capabilities

  • Nanoscale 3D topographical imaging

  • Surface roughness measurements (Ra, Rq, Rz)

  • Ultra-low load nanoindentation

  • Hardness and elastic modulus determination

  • Mechanical property mapping

  • Force-distance curve analysis

  • Scratch resistance evaluation

  • Adhesion and deformation studies

  • Quantitative nanomechanical characterization

Product Overview

The Anton Paar STEP 700 is an advanced nanomechanical characterization platform that combines Atomic Force Microscopy (AFM) with ultra-nanoindentation and mechanical property mapping capabilities. Integrated with the MCT³, UNHT³, and Nanosurf Nanite AFM modules, the system enables comprehensive analysis of surface topography, roughness, hardness, elastic modulus, adhesion, and nanomechanical behavior at micro- and nanometer scales.

This versatile platform is particularly valuable for biomaterials, dental materials, polymers, coatings, thin films, and advanced material research, providing both morphological and mechanical characterization within a single integrated system.

Key Features

  • High-resolution Atomic Force Microscopy (AFM)

  • Three-dimensional nanoscale surface imaging

  • Ultra Nano Hardness Testing (UNHT³)

  • Quantitative nanomechanical property mapping

  • Surface roughness and texture analysis

  • Elastic modulus and hardness determination

  • Adhesion and force spectroscopy measurements

  • High-precision indentation and scratch testing

  • Non-destructive surface characterization

  • Automated data acquisition and analysis

Applications

  • Dental material characterization

  • Biomaterials and tissue engineering research

  • Surface roughness evaluation

  • Nanoindentation and hardness testing

  • Thin film and coating analysis

  • Polymer characterization

  • Nanotechnology and nanomaterials research

  • Wear and tribological studies

  • Surface modification assessment

  • Microstructural and mechanical property evaluation

Technical Capabilities

  • Nanoscale 3D topographical imaging

  • Surface roughness measurements (Ra, Rq, Rz)

  • Ultra-low load nanoindentation

  • Hardness and elastic modulus determination

  • Mechanical property mapping

  • Force-distance curve analysis

  • Scratch resistance evaluation

  • Adhesion and deformation studies

  • Quantitative nanomechanical characterization