The D8 ADVANCE is a high-performance X-ray diffraction (XRD) system designed for phase identification, quantitative phase analysis, crystal structure determination, residual stress analysis, texture analysis, thin-film characterization, and small-angle X-ray scattering (SAXS). Its modular architecture enables analysis of powders, bulk materials, thin films, fibers, and liquids on a single platform.
Advanced X-ray Powder Diffraction (XRD) capabilities
Supports XRD, SAXS, WAXS, and PDF analysis
Automated optics and detector configuration (DAVINCI.DESIGN)
High-precision D8 goniometer with excellent angular accuracy
Dynamic Beam Optimization (DBO) for enhanced data quality
Compatible with multiple detectors, including LYNXEYE XE-T
Automated sample changers for high-throughput analysis
Non-ambient measurements with temperature, humidity, and pressure control options
User-friendly DIFFRAC.SUITE software platform for acquisition and analysis.
Crystal structure analysis
Phase identification and quantification
Residual stress measurement
Texture analysis
Thin-film characterization
Nanomaterials and advanced materials research
Pharmaceutical analysis
Cement and building materials characterization
Metals and alloys research
Battery and energy-storage materials evaluation
Angular range: <1° to >150° (2θ)
Supports multiple X-ray wavelengths (Cr, Co, Cu, Mo, Ag)
High-speed data acquisition with advanced detectors
Automated switching between diffraction geometries
Suitable for powders, thin films, bulk solids, fibers, and coatings
The D8 ADVANCE is a high-performance X-ray diffraction (XRD) system designed for phase identification, quantitative phase analysis, crystal structure determination, residual stress analysis, texture analysis, thin-film characterization, and small-angle X-ray scattering (SAXS). Its modular architecture enables analysis of powders, bulk materials, thin films, fibers, and liquids on a single platform.
Advanced X-ray Powder Diffraction (XRD) capabilities
Supports XRD, SAXS, WAXS, and PDF analysis
Automated optics and detector configuration (DAVINCI.DESIGN)
High-precision D8 goniometer with excellent angular accuracy
Dynamic Beam Optimization (DBO) for enhanced data quality
Compatible with multiple detectors, including LYNXEYE XE-T
Automated sample changers for high-throughput analysis
Non-ambient measurements with temperature, humidity, and pressure control options
User-friendly DIFFRAC.SUITE software platform for acquisition and analysis.
Crystal structure analysis
Phase identification and quantification
Residual stress measurement
Texture analysis
Thin-film characterization
Nanomaterials and advanced materials research
Pharmaceutical analysis
Cement and building materials characterization
Metals and alloys research
Battery and energy-storage materials evaluation
Angular range: <1° to >150° (2θ)
Supports multiple X-ray wavelengths (Cr, Co, Cu, Mo, Ag)
High-speed data acquisition with advanced detectors
Automated switching between diffraction geometries
Suitable for powders, thin films, bulk solids, fibers, and coatings